University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 569

Type:IAP Research Reports
IAP ID:569
Authors:Axel Murk
Title:JEM/SMILES AOPT EM, Part 6: Summary of the Electromagnetic Tests
Series:IAP Research Report
Number:2003-10
Institution:Institut für angewandte Physik, Universität Bern
Address:Bern, Switzerland
Year:2003
pdf:[0.70 MB]

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