University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 3678

Type:Articles in Journals
IAP ID:3678
Authors:Andreas Riedo, Michael Ruosch, Martin Frenz, Jürgen A. Scheer, Peter Wurz
Title:On the surface characterization of an Al2O3 charge state conversion surface using ion scattering and atomic force microscope measurements
Journal:Applied Surface Science
Volume:258
Pages:7292-7298
doi:10.1016/j.apsusc.2012.03.139
Year:2012
Status:published
pdf:[1.04 MB]

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