University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 3473

Type:Articles in Journals
IAP ID:3473
Authors:Daniel Sütterlin, Daniel Erni, Volker Schlott, Hans Sigg, Heinz Jäckel, Axel Murk,
Title:Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
Journal:Review of Scientific Instruments
Volume:81
Number:10
Pages:104702
doi:10.1063/1.3480997
Year:2010
Status:published
pdf:[5.14 MB]

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