University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 3365

Type:Articles in Journals
IAP ID:3365
Authors:Mike Schwank, Ingo Völksch, Jean-Pierre Wigneron, Yann H. Kerr, Arnaud Mialon, Patricia de Rosnay, Christian Mätzler
Title:Comparison of two surface reflectivity models and validation with radiometer measurements
Journal:IEEE Transactions on Geoscience and Remote Sensing
Volume:48
Number:1
Pages:325-337
doi:10.1109/TGRS.2009.2026894
Year:2010
Status:published
pdf:[0.63 MB]

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