University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 2733

Type:Articles in Journals
IAP ID:2733
Authors:Q. Fang, M. Meier, J.J. Yu, Z.M. Wang, J.-Y. Zhang, J.X. Wu, A. Kenyon, P. Hoffmann, Ian W. Boyd
Title: FTIR and XPS investigation of Er-doped SiO2-TiO2 films
Journal: Materials Science and Engineering B
Volume:105
Number:1-3
Pages:209-213
Year:2003
Status:published

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