University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 2688

Type:Conference Proceedings
IAP ID:2688
Authors:Daniel Sütterlin, Volker Schlott, Hans Sigg, Daniel Erni, Heinz Jäckel, Axel Murk
Title:Single-shot electron bunch length measurements using a spatial auto-correlation interferometer
Title of proceedings:27th International Free Electron Laser Conference
Pages:THPP072
Year:2005
pdf:[0.12 MB]

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