University of Bern

Institute of Applied Physics

Publications

Details of Publication IAP ID 216

Type:IAP Research Reports
IAP ID:216
Authors:A. Murk
Title:JEM/SMILES AOPT EM, Part 2 Bandpass Characteristic and Beam Pattern after Thermal Cycling
Series:IAP Research Report
Number:2002-04
Institution:Institut für angewandte Physik, Universität Bern
Address:Bern, Switzerland
Year:2002
pdf:[1.19 MB]

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